TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• Lorentz microscopy and electron holography, along with simultaneous structural and chemical characterization techniques such as electron diffraction, 4D STEM, and energy-dispersive X-ray (EDX) and electron energy loss spectroscopy (EELS), enable a correlative characterization to investigate magnetic

• all measurements have been completed, KOH etching can be conducted, and as a result, the sample is placed on a free-standing SiN membrane and can be studied under TEM. This is useful for future high-frequency correlative characterization of multilayer spintronic devices. Another possible further

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• Kevlar® K29 fibers, we find remarkable differences between the internal structures of the two fibers, and posit connections between our measurements and multifunctional performance studies from the literature. Keywords: atomic force microscopy; correlative characterization; high-performance fibers

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• gallium-ion FIBs. The resulting combined AFM–HIM instrument would, therefore, profit from the sub-nanometer lateral resolution of the HIM and the atomic resolution in the vertical axis of the AFM, proving particularly powerful for high-resolution correlative characterization of non-conductive samples